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High‐Resolution Nanospectroscopy of Boron Nitride Nanotubes
Author(s) -
Datz Dániel,
Németh Gergely,
Tóháti Hajnalka M.,
Pekker Áron,
Kamarás Katalin
Publication year - 2017
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/pssb.201700277
Subject(s) - boron nitride , materials science , near field scanning optical microscope , fourier transform infrared spectroscopy , absorption (acoustics) , nanoscopic scale , spectroscopy , resolution (logic) , optics , infrared , fourier transform , optoelectronics , optical microscope , nanotechnology , scanning electron microscope , physics , quantum mechanics , artificial intelligence , computer science , composite material
Scattering type scanning near‐field optical microscopy (s‐SNOM) is an effective tool for the nanoscale examination of nano‐objects. In this paper, we present a modified device setup that enables spectroscopic measurements with a tunable laser, even without an FTIR (Fourier Transform Infrared) spectroscopy add‐on. We demonstrate the effectiveness of this setup by measurements on boron nitride nanotubes (BNNTs). In far‐field absorption measurements, BNNTs have a characteristic peak around 1375 cm −1 due to a phonon polariton mode. This peak is also visible in near‐field measurements along with several other peaks that are not present in the far‐field spectrum. As these peaks are caused by local defects, their spatial distribution reveals the defect structure of individual nanotubes.
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