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Defect recognition in crystalline silicon solar cells by X‐ray tomosynthesis with layer resolution
Author(s) -
Voland Virginia,
Hoyer Ulrich,
Auer Richard,
Salamon Michael,
Uhlmann Norman,
Brabec Christoph J.
Publication year - 2015
Publication title -
progress in photovoltaics: research and applications
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.286
H-Index - 131
eISSN - 1099-159X
pISSN - 1062-7995
DOI - 10.1002/pip.2411
Subject(s) - tomosynthesis , photovoltaics , photovoltaic system , materials science , silicon , quality (philosophy) , computer science , solar cell , layer (electronics) , crystalline silicon , x ray , optoelectronics , optics , nanotechnology , physics , medicine , engineering , electrical engineering , cancer , breast cancer , mammography , quantum mechanics
ABSTRACT The increasing demand for higher quality in solar cell production led to the development of several inline control methods. Beneath the image‐guided methods, X‐ray is not yet very well investigated for the application in photovoltaic research but shows high potential. In contrast to the ordinary X‐ray radioscopic method, the tomosynthesis technique exhibits additional depth information of the solar cells and modules. In this article, several applications of tomosynthesis for the investigation of solar cells and modules are studied. It will be shown what potential the application of X‐ray and especially tomosynthesis has as quality control tool for photovoltaics. Copyright © 2013 John Wiley & Sons, Ltd.