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19.2: Distinguished Paper : Characterization of Electron‐Hole Pair Migration and Trapping in Rare Earth Doped YBO 3 under Vacuum Ultraviolet Excitation
Author(s) -
Wallace Max,
Diaz Anthony L.
Publication year - 2013
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/j.2168-0159.2013.tb06181.x
Subject(s) - trapping , doping , excitation , activator (genetics) , atomic physics , electron , vacuum ultraviolet , ultraviolet , chemistry , materials science , physics , optoelectronics , ecology , biochemistry , quantum mechanics , gene , biology
We have measured host‐to‐activator energy transfer efficiencies in rare‐earth doped YBO 3 under vacuum ultraviolet excitation. From these data, relative electron‐hole (e‐h) pair trapping rate constants can be estimated. Our analysis suggests a correlation between e‐h trapping efficiency and the energy of activator electronic states relative to the host conduction band.