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Carrier Concentration Profile of GaN Layers bei Using Additional Dried NH 3
Author(s) -
Franzheld R.,
Sobotta H.,
Seifert W.,
Butter E.
Publication year - 1986
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170210528
Subject(s) - philosophy