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Mikrohärteuntersuchungen an Einkristallen der Verbindungen Tl 3 BX 4 , (B = V, Nb, Ta; X=S, Se)
Author(s) -
Wacker K.,
Buck P.
Publication year - 1982
Publication title -
crystal research and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.377
H-Index - 64
eISSN - 1521-4079
pISSN - 0232-1300
DOI - 10.1002/crat.2170171022
Subject(s) - vickers hardness test , indentation hardness , analytical chemistry (journal) , anisotropy , crystallography , materials science , chemistry , physics , microstructure , optics , chromatography
Abstract Vickers microhardness measurements were performed on single crystals of compounds Tl 3 BX 4 (B = V, Nb, Ta; X = S, Se). The anisotropy of the hardness on the (111)‐plane was beyond the standard deviation. Besides the load‐dependent Vickers hardness HV , the corrected, load‐independent hardness HV c was determined. Tl 3 VS 4 showed the highest value of hardness ( HV = 66 kp/mm 2 at 15 p load), the othe compounds differ only slightly in hardness.