Mikrohärteuntersuchungen an Einkristallen der Verbindungen Tl 3 BX 4 , (B = V, Nb, Ta; X=S, Se) | Zendy

Wacker K. | Zendy; Buck P. | Zendy

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Mikrohärteuntersuchungen an Einkristallen der Verbindungen Tl 3 BX 4 , (B = V, Nb, Ta; X=S, Se)

Author(s) -

Wacker K.,

Buck P.

Publication year - 1982

Publication title -

crystal research and technology

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.377

H-Index - 64

eISSN - 1521-4079

pISSN - 0232-1300

DOI - 10.1002/crat.2170171022

Subject(s) - vickers hardness test , indentation hardness , analytical chemistry (journal) , anisotropy , crystallography , materials science , chemistry , physics , microstructure , optics , chromatography

Vickers microhardness measurements were performed on single crystals of compounds Tl 3 BX 4 (B = V, Nb, Ta; X = S, Se). The anisotropy of the hardness on the (111)‐plane was beyond the standard deviation. Besides the load‐dependent Vickers hardness HV , the corrected, load‐independent hardness HV c was determined. Tl 3 VS 4 showed the highest value of hardness ( HV = 66 kp/mm 2 at 15 p load), the othe compounds differ only slightly in hardness.

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