Premium
Precise Extraction of Charge Carrier Mobility for Organic Transistors
Author(s) -
Xu Yong,
Li Yun,
Li Songlin,
Balestra Francis,
Ghibaudo Gerard,
Li Wenwu,
Lin YenFu,
Sun Huabin,
Wan Jing,
Wang Xinran,
Guo Yufeng,
Shi Yi,
Noh YongYoung
Publication year - 2020
Publication title -
advanced functional materials
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 6.069
H-Index - 322
eISSN - 1616-3028
pISSN - 1616-301X
DOI - 10.1002/adfm.201904508
Subject(s) - organic field effect transistor , transistor , electron mobility , extraction (chemistry) , materials science , optoelectronics , calibration , fabrication , field effect transistor , dielectric , capacitance , computer science , voltage , chemistry , electrical engineering , chromatography , physics , electrode , medicine , alternative medicine , quantum mechanics , pathology , engineering
Abstract Unreliable mobility values, and particularly greatly overestimated values and severely distorted temperature dependences, have recently hampered the development of the organic transistor field. Given that organic field‐effect transistors (OFETs) have been routinely used to evaluate mobility, precise parameter extraction using the electrical properties of OFETs is thus of primary importance. This review examines the origins of the various mobilities that must be determined for OFET applications, the relevant extraction methods, and the data selection limitations, which help in avoiding conceptual errors during mobility extraction. For increased precision, the review also discusses device fabrication considerations, calibration of both the specific gate‐dielectric capacitance and the threshold voltage, the contact effects, and the bias and temperature dependences, which must actually be handled with great care but have mostly been overlooked to date. This review serves as a systematic overview of the OFET mobility extraction process to ensure high precision and will also aid in improving future research.