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Negatively Charged Donor Centers in Ultrathin ZnSe:N Layers
Author(s) -
Strauf S.,
Michler P.,
Gutowski J.,
Klude M.,
Hommel D.,
Wolverson D.,
Davies J.J.
Publication year - 2002
Publication title -
physica status solidi (b)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.51
H-Index - 109
eISSN - 1521-3951
pISSN - 0370-1972
DOI - 10.1002/1521-3951(200201)229:1<245::aid-pssb245>3.0.co;2-s
Subject(s) - photoluminescence , acceptor , shallow donor , scattering , excitation , materials science , spectroscopy , raman scattering , raman spectroscopy , molecular physics , chemistry , atomic physics , condensed matter physics , doping , optoelectronics , optics , physics , quantum mechanics
Pseudomorphically grown p‐ZnSe:N layers being as thin as 100, 20, 10 and 5 nm embedded in ZnMgSSe barriers were investigated by means of photoluminescence and spin‐flip‐Raman (SFR) scattering spectroscopy. A new donor–acceptor‐pair (DAP) band has been observed involving a very shallow donor with a binding energy of (19 ± 2) meV and the well‐known N acceptor on Se site. Further evidence for a new donor center is given by transitions in angle‐dependent SFR scattering measurements which correspond to an isotropic (donor‐like) g ‐value of (1.49 ± 0.03). The 19 meV donor is interpreted as the negatively charged state of the usually found 52 meV deep donor in ZnSe:N. This is supported by the temperature behavior of the DAP band and, further, by its pronounced appearance for resonant excitation into the barriers quite similar to the behavior of trions.

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