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Ion trap MS n genealogical mapping—approaches for structure elucidation of novel products of consecutive fragmentations of morphinans
Author(s) -
Strife Robert J.,
Robosky Lora C.,
Garrett Garry,
Ketcha Marcia M.,
Shaffer John D.,
Zhang Nan
Publication year - 2000
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/(sici)1097-0231(20000229)14:4<250::aid-rcm865>3.0.co;2-9
Subject(s) - chemistry , fragmentation (computing) , electrospray ionization , ionization , ion , electron ionization , ion trap , mass spectrometry , electrospray , analytical chemistry (journal) , computational chemistry , organic chemistry , chromatography , computer science , operating system
Abstract The analysis of data within multi‐generational, genealogical, electrospray ionization/MS n fragmentation maps is discussed in reference to the structure elucidation of morphinans, an important class of pharmacological compounds. Various general approaches to separate and understand observed processes are discussed. These include: (1) Simple synthetic schemes incorporating deuterium and 13 C into morphinans to study later‐generation, O‐methyl group migration; (2) labeling to understand ‘intense’ signals for even‐electron to odd‐electron ion ‘switching’ events; (3) gas phase ‘synthesis’ of proposed MS 3 ions via an independent route, using chemical ionization (CI) MS/MS of naphthalenes and analysis via a bench‐top El/Cl ion trap; (4) a useful synthetic paradigm for generating proposed carbonium ion structures at MS 4 via electrospray ionization (ESI) of easily synthesized amines; (5) the analysis of an oxidation product and correlation of MS n data of a switched, odd‐electron species with electron ionization and low‐pressure, low‐energy charge exchange data; and (6) a new way of summarizing MS n data. Copyright © 2000 John Wiley & Sons, Ltd.