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Secondary ion mass spectrometry characterization of IrO 2 –Ta 2 O 5 thin films: effect of relative composition on electrode properties
Author(s) -
Daolio S.,
Battisti A. De,
Fabrizio M.,
Nanni L.,
Piccirillo C.
Publication year - 1998
Publication title -
rapid communications in mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.528
H-Index - 136
eISSN - 1097-0231
pISSN - 0951-4198
DOI - 10.1002/(sici)1097-0231(19981030)12:20<1574::aid-rcm352>3.0.co;2-p
Subject(s) - chemistry , secondary ion mass spectrometry , electrochemistry , electrode , mass spectrometry , oxide , analytical chemistry (journal) , characterization (materials science) , alkali metal , ion , static secondary ion mass spectrometry , inorganic chemistry , nanotechnology , chromatography , materials science , organic chemistry
Abstract IrO 2 and Ta 2 O 5 mixed oxide coatings were deposited on Ti supports in order to fabricate dimensionally stable electrodes used in chloro‐alkali technology. Secondary ion mass spectrometry (SIMS) and electrochemical experiments were carried out in order to characterize these materials. Electrochemical tests found the highest electrocatalytic activity for 50% IrO 2 –50% Ta 2 O 5 electrodes. SIMS analyses are in harmony with these results, and it is shown that IrO 2 is more diluted on the surface for noble metal oxide concentrations higher than 50%. Finally, it was observed by SIMS that support material migration was favoured at the highest concentrations of Ta 2 O 5 stabilizer. © 1998 John Wiley & Sons, Ltd.