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Atomic force microscopy—a powerful tool for industrial applications
Author(s) -
Karbach A.,
Drechsler D.
Publication year - 1999
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(199905/06)27:5/6<401::aid-sia533>3.0.co;2-a
Subject(s) - atomic force microscopy , nanotechnology , ceramic , transmission electron microscopy , materials science , thermoplastic polyurethane , mesoscale meteorology , polymer , morphology (biology) , resolution (logic) , composite material , computer science , physics , geology , paleontology , artificial intelligence , meteorology , elastomer
Abstract The phenomenal success of atomic force microscopy (AFM)in industry is based on the easy access of samples with practicalinterest due to the high resolution and high contrast of the methodunder controllable ambient conditions. In our case, the highresolution of AFM is mainly used in the mesoscale range. The highcontrast using tapping mode AFM provides information forunderstanding morphological features of soft organic material such aspolymers and coatings and also for hard metallic and ceramic systems.But for correlation of the observed morphology with chemical speciesthe combined use to AFM and transmission electron microscopy often isnecessary. As an example elucidation of the morphology ofthermoplastic polyurethane will be discussed in more detail.Copyright © 1999 John Wiley & Sons, Ltd.