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On the XPS Analysis of Si–OH Groups at the Surface of Silica
Author(s) -
Paparazzo E.
Publication year - 1996
Publication title -
surface and interface analysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.52
H-Index - 90
eISSN - 1096-9918
pISSN - 0142-2421
DOI - 10.1002/(sici)1096-9918(19960930)24:10<729::aid-sia183>3.0.co;2-p
Subject(s) - x ray photoelectron spectroscopy , fermi surface , physics , materials science , nuclear physics , electron , nuclear magnetic resonance