English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Zendy Pro

Presents the zaia usage as premium feature

ZAIA

Presents AI Discovery search usage as a premium feature

AI Discovery

Presents AI Discovery explain and summary usage as a premium feature

Content Analysis

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Presents the pdf analysis as premium feature

PDF Analysis

1500 Top-up

3000 Top-up

Zendy Basic

2500 Top-up

Zendy Unlimited

Presents the access of premium content as premium feature

Premium Content

The conventional method allows testing of only one chip at a time (single-site testing). However, due to advancements in testing procedures, current test technologies are able to conduct dual-sites testing, quad-sites testing, octal-sites testing, 16-sites testing, 32-sites testing, and so on. In line with this, the multi-site testing approach is a method that increases the number of chips that can be tested in a single touch-up. This method allows more chips to be tested per hour, thus improving the testing throughput. In this research the author take the initiative to develop a multi-sites throughput model to investigate the effectiveness of multi-site testing approach on improving the testing throughput. In the case study, five multi-site configurations were applied. These configurations were single-site, quad-sites, octal-sites, ×16-sites, and ×32-sites. A hypothesis was analyzed by using one-way ANOVA and Post Hoc Test.

A case study on the effectiveness of Multi-sites test handler to improve of Production Output