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By combining scanning multiprobe (MP) microscopy with optical methods such as light-modulated spectroscopy (LMS) and optical pump-probe (OPP) method, we have succeeded in developing a microscopy method for measuring electronic structures and photoinduced carrier dynamics in microscopic structures. We demonstrated its performance by analyzing the electronic structures in a monolayer island of a WSe2/MoSe2 in-plane heterostructure grown on a SiO2/Si substrate. By observing the field-effect transistor characteristics and photocurrent mapping over the heterostructure by LMS, we were able to visualize the band structure. Positional dependence of carrier dynamics was also successfully probed by OPP-MP spectroscopy.

applied physics express

Development of laser-combined scanning multiprobe spectroscopy and application to analysis of WSe<sub>2</sub>/MoSe<sub>2</sub> in-plane heterostructure

Development of laser-combined scanning multiprobe spectroscopy and application to analysis of WSe2/MoSe2 in-plane heterostructure

Development of laser-combined scanning multiprobe spectroscopy and application to analysis of WSe₂/MoSe₂ in-plane heterostructure