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Many nonlinear electronic circuits showing fast switchingbehavior exhibit jump effects which occurs when the state space ofthe electronic system contains a fold. This leads to difficultiesduring the simulation of these systems with standard circuit simulators.A method to overcome these problems is by regularization, where parasiticinductors and capacitors are added at the suitable locations.However, the transient solution will not be reliable if this regularizationis not done in accordance with Tikhonov's Theorem. A geometric approachis taken to overcome these problems by explicitly computing the statespace and jump points of the circuit. Until now, work has been donein analyzing example circuits exhibiting this behavior for BJT transistors.In this work we apply these methods to MOS circuits (Schmitt trigger,flip flop and multivibrator) and present the numerical results. Toanalyze the circuits we use the EKV drain current model as equivalentcircuit model for the MOS transistors

Differential Algebraic Equations of MOS Circuits and Jump Behavior