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In this paper, we characterize the interplay between power consumption and performance of a matchline-based Content Addressable Memory and then propose the use of a multi-Vdd design to save power and increase post-fabrication tunability. Exploration of the power consumption behavior of a CAM chip shows the drastically different behavior among the components and suggests the use of different and independent power supplies. The complete design, simulation and testing of a multi-Vdd CAM chip along with an exploration of the multi-Vdd design space are presented. Our analysis has been applied to simulated models on two different technology nodes (130 nm and 45 nm), followed by experiments on a 246-kb test chip fabricated in 130 nm Global Foundries Low Power CMOS technology. The proposed design, operating at an optimal operating point in a triple-Vdd configuration, increases the power-delay operation range by 2.4 times and consumes 25.3% less dynamic power when compared to a conventional single-Vdd design operating over the same voltage range with equivalent noise margin. Our multi-Vdd design also helps save 51.3% standby power. Measurement results from the test chip combined with the simulation analysis at the two nodes validate our thesis.

Multi-Vdd Design for Content Addressable Memories (CAM): A Power-Delay Optimization Analysis