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This study describes the concise exfoliation of multilayer Ti 3 C 2 T  x   MXene containing residual aluminum atoms. Treatment with tetramethylammonium base in a co-solvent of tetrahydrofuran and H 2 O produced single-layer Ti 3 C 2 T  x  , which was confirmed  via  atomic force microscopy observations, with an electrical conductivity 100+ times that of Ti 3 C 2 T  x   prepared under previously reported conditions. The scanning electron microscopy and X-ray diffraction measurements showed that the exfoliated single-layer Ti 3 C 2 T  x   MXenes were reconstructed to assembled large-domain layered films, enabling excellent macroscale electric conductivity. X-ray photoelectron spectroscopy confirmed the complete removal of residual Al atoms and the replacement of surface fluorine atoms with hydroxy groups. Using the exfoliated dispersion, a flexible transparent conductive film was formed and demonstrated in an electrical application.

Exfoliation of Al-Residual Multilayer MXene Using Tetramethylammonium Bases for Conductive Film Applications