English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

A method to measure wideband permeability was developed for 5-mm-square magnetic thin film from 0.1 to 10 GHz by using a shielded short-circuited microstrip line as the test fixture. The S11 parameters of the test fixture were measured with a vector network analyzer (VNA). The permeability was derived, based on the lumped element approximation, by comparing S11s with S11os which corresponded to without and with a strong magnetic field parallel to the microwave magnetic field caused by the microstrip line. In this case, the influence of substrate on which the thin film prepared could not be neglected due to the small gap between the microstrip line and the substrate. We introduced a method to derive an effective permittivity e caused by the substrate by comparing S11o of blank fixture with S11os of fixture with sample under a strong static magnetic field. We also propose a method of determining whether the lumped element approximation is valid or not.

Permeability Measurements of Magnetic Thin Films using Shielded Short-Circuited Microstrip Lines