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H. Sato*, M. Yamanouchi*,**, S. Ikeda*,**,****, S. Fukami*, F. Matsukura***,*,**, and H. Ohno*,**,***,**** *Center for Spintronics Integrated Systems, Tohoku Univ., 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan **Laboratory for Nanoelectronics and Spintronics, Research Institute for Electrical Communication, Tohoku Univ., 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan ***WPI Advanced Institute for Materials Research (WPI-AIMR), Tohoku Univ., 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan ****Center for Innovative Integrated Electronic Systems, Tohoku Univ., 468-1 Aoba, Aramaki-Aza, Aoba-ku, Sendai 980-0845, Japan

MgO/CoFeB/Ta/CoFeB/MgO recording structure with low intrinsic critical current and high thermal stability