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The dielectric parameters in a very wide frequency range 10–350 GHz in the modern low-loss ceramics, the aluminum nitride AlN and aluminum oxide Al2O3, fabricated in China and Russia, are investigated. The measurements of the refractive index and dielectric loss tangent were conducted using different techniques and measurement setups. For the measurement of dielectric loss in the microwave range, at frequency of 9.4 GHz, the closed metal cavity resonator was used. For the measurements of refractive index in the millimeter (MM) and submillimeter (SubMM) ranges, at the frequencies of 60–350 GHz, both open resonators and scalar network analyzers were used. For the measurements of dielectric loss in the MM and SubMM ranges different open resonators were used. The refractive index and dielectric loss were measured at f=70–350 GHz. in three Chinese samples of ceramic AlN and two samples of ceramic Al2O3. In all samples the losses are very low: tan <10. Also the dielectric loss was measured in newest Russian sample of ceramic Al2O3, fabricated in the PC "Magneton" (of the brand “VK100M”). The loss in it is the lowest loss observed among ceramics Al2O3. Moreover, this loss is only slightly higher, that in the corresponding single crystal (sapphire). The nature of observed losses is considered. The loss frequency dependencies in the MM and SubMM ranges in all ceramics Al2O3 studied can be well described by JOURNAL OF RADIO ELECTRONICS (ZHURNAL RADIOELEKTRONIKI), ISSN 1684-1719, N2, 2018 2 the linear approximation. Such dependence corresponds to the mechanism of socalled one-phonon lattice loss induced by the crystal lattice disorder.

Dielectric parameters of the modern low-loss ceramics in the microwave, millimeter, and submillimeter ranges.