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TiO 2  thin films have been deposited on glass substrates with and without ZnO underlayer by sol-gel dip coating process. XRD patterns show the formation of anatase phase with the diffraction lines (1 0 1) and (2 0 0) in TiO 2 /glass sample. In TiO 2 /(ZnO/glass) sample, TiO 2  is composed of anatase phase with the diffraction line (2 0 0) but the diffraction peaks of ZnO wurtzite are also well-defined. The determination of the refractive index and the thickness of the waveguiding layers has been performed by m-lines spectroscopy. The thickness of TiO 2  thin films deduced by Rutheford Backscattering Geometry (RBS) agrees well with that obtained by m-lines spectroscopy. TiO 2 /glass sample exhibits one guided TE 0  and TM 0  polarized modes. In TiO 2 /(ZnO/glass) sample, only, TE 0  single mode has been excited due to cutoff condition.

TiO2 waveguides thin films prepared by sol-gel method on glass substrates with and without ZnO underlayer

TiO₂ waveguides thin films prepared by sol-gel method on glass substrates with and without ZnO underlayer