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Anti-reflection coatings based on SnO2, SiO2, Si3N4 films for photodiodes operating in ultraviolet and visible spectral ranges
Author(s) -
Yu. G. Dobrovolskiy
Publication year - 2011
Publication title -
semiconductor physics, quantum electronics and optoelectronics/semiconductor physics quantum electronics and optoelectronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.185
H-Index - 2
eISSN - 1605-6582
pISSN - 1560-8034
DOI - 10.15407/spqeo14.03.298
Subject(s) - ultraviolet , photodiode , materials science , optoelectronics , reflection (computer programming) , optics , reflectivity , ultraviolet a , physics , computer science , medicine , dermatology , programming language

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