English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

We suggest stochastic simulation techniques for solving two classes of linear and nonlinear inverse and ill-posed problems: (1) recovering the particle nanosize distribution from diffusion battery measurements, and (2) retrieving the step structure of the epitaxial films from the x-ray diffraction analysis. To solve these problems we develop three stochastic based methods: (1) the random projection method, a stochastic version of the Kaczmarz method, (2) a randomized SVD method, and (3) stochastic genetic algorithm. Results of comparative simulations of the three methods are also presented.

journal of inverse and ill-posed problems

Stochastic algorithms for solving linear and nonlinear inverse ill-posed problems for particle size retrieving and x-ray diffraction analysis of epitaxial films