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The X-ray diffraction and atomic force microscopy are used to examine the microstructure of La1.85Sr0.15CuO4 films grown by pulsed laser deposition on LaSrAlO4 substrates. The films grow with different degrees of built-in strain, ranging from a large compressive to a large tensile in-plain strain. The tensile strain cannot be attributed to a substrate-related strain. The possible origins of the tensile strain are discussed.

Microstructure of the Pulsed Laser Deposited LaSrCuO Films