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Deuterium Retention in the Near-Surface Layer of W Single Crystal Irradiated with 6 keV Deuterium Ions
Author(s) -
Ievgen I. Arkhipov,
А.Е. Gorodetsky,
А.П. Захаров
Publication year - 2003
Publication title -
physica scripta
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.415
H-Index - 83
eISSN - 1402-4896
pISSN - 0031-8949
DOI - 10.1238/physica.topical.103a00068
Subject(s) - deuterium , fluence , irradiation , materials science , ion , vacancy defect , surface layer , analytical chemistry (journal) , crystal (programming language) , dislocation , single crystal , layer (electronics) , atomic physics , crystallography , chemistry , nanotechnology , nuclear physics , physics , chromatography , computer science , organic chemistry , programming language , composite material

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