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The failure of the metallic nanowire has raised concerns due to its applied reliability in nanoelectromechanical system. In this article, the breaking failure is studied for the [100], [110], and [111] single-crystal copper nanowires at different strain rates. The statistical breaking position distributions of the nanowires have been investigated to give the effects of strain rate and crystallographic orientation on micro-atomic fluctuation in the symmetric stretching of the nanowires. When the strain rate is less than 0.26% ps -1 , macro-breaking position distributions exhibit the anisotropy of micro-atomic fluctuation. However, when the strain rate is larger than 3.54% ps -1 , the anisotropy is not obvious because of strong symmetric shocks.

Shock-induced breaking of the nanowire with the dependence of crystallographic orientation and strain rate