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We review the status of the understanding of single-electron transport (SET)devices with respect to their applicability in metrology. Their envisioned roleas the basis of a high-precision electrical standard is outlined and isdiscussed in the context of other standards. The operation principles of singleelectron transistors, turnstiles and pumps are explained and the fundamentallimits of these devices are discussed in detail. We describe the variousphysical mechanisms that influence the device uncertainty and review theanalytical and numerical methods needed to calculate the intrinsic uncertaintyand to optimise the fabrication and operation parameters. Recent experimentalresults are evaluated and compared with theoretical predictions. Although thereare discrepancies between theory and experiments, the intrinsic uncertainty isalready small enough to start preparing for the first SET-based metrologicalapplications.Comment: 39 pages, 14 figures. Review paper to be published in International  Journal of Modern Physics

TOWARDS SINGLE-ELECTRON METROLOGY