English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

Uneven illumination is a common problem in practical optical systems designed for machine vision applications, and it leads to significant errors when phase-shifting algorithms (PSA) are used to reconstruct the surface of a moving object. We propose an illumination-reflectivity-focus model to characterize this uneven illumination effect on phase-measuring profilometry. With this model, we separate the illumination factor effectively and consider the phase reconstruction from an optimization perspective. Furthermore, we formulate an illumination-invariant phase-shifting algorithm (II-PSA) to reconstruct the surface of a moving object under an uneven illumination environment. Experimental results show that it can improve the reconstruction quality both visually and numerically.

Errata: Illumination-invariant phase-shifting algorithm for three-dimensional profilometry of a moving object