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. The knowledge of the complex refractive indices of all thin layers in organic solar cells (OSCs) is a prerequisite for comprehensive optical device simulations that are particularly important for sophisticated device architectures, such as tandem OSCs. Therefore, refractive indices are often determined via spectroscopic ellipsometry and subsequent time-consuming modeling. Here, we investigate a modeling approach that allows for the determination of complex refractive indices of bulk-heterojunctions by superimposing the optical models of the respective fullerenes and polymers. The optical constants of neat [6,6]-phenyl C71-butyric acid methyl ester (PC71BM), poly{[4,4’-bis(2-ethylhexyl)dithieno(3,2-b;2’,3’-d)silole]-2,6-diyl-alt-(2,1,3-benzothidiazole)-4,7-diyl} (PSBTBT) and poly[2,6-(4,4-bis(2-ethylhexyl)-4H-cyclopenta[2,1-b;3,4-b′′]dithiophene)-alt-4,7-(2,1,3-benzothiadiazole) (PCPDTBT) are determined, covering the OSC relevant spectral region from 250 to 1,000 nm. Then the blends PSBTBT:PC71BM and PCPDTBT:PC71BM are described within an effective medium approximation. From this approximation, the mass density ratio of polymer and fullerene can be derived. This approach furthermore allows for a uniaxial anisotropic optical description of the polymers and provides insight into thin-film morphology. In contrast to x-ray diffraction experiments, this method also allows for probing amorphous materials. Spectroscopic ellipsometry can be a valuable tool for the investigation of bulk-heterojunction morphologies of the latest high-performance OSC materials that exhibit a low degree of crystallinity.

journal of photonics for energy

Modeling approach to derive the anisotropic complex refractive index of polymer:fullerene blends for organic solar cells utilizing spectroscopic ellipsometry