English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Tools annual

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools monthly

Global: Zendy Plus monthly

Presents the access of premium content as premium feature

Premium Content

Global: Zendy Plus annual

Global: Zendy Free Plan

In this work, vertical NiO/Ga2O3 heterojunction diodes (HJDs) integrated with SiN<italic>x</italic>/Al2O3 double-layered insulating field plate (FP) structures have been demonstrated. With the additional post-annealing, the resultant diode exhibits a decreased differential specific on-resistance (<inline-formula> <tex-math notation="LaTeX">$\text{R}_{\mathrm{ on,sp}}$ </tex-math></inline-formula>) of 5.4 <inline-formula> <tex-math notation="LaTeX">$\text{m}\boldsymbol{\Omega } \cdot $ </tex-math></inline-formula>cm2 and an enhanced breakdown voltage (BV) of 1036 V. The improved performance is attributed by the combination of the FP-suppressed crowding electric field at the device edge and the reduced trap density at the NiO/Ga2O3 interface. In particular, the near-unity ideality factor has been achieved for this p-n HJD at an elevated temperature of 275 &#x00B0;C, indicating that the diffusion current is dominated. The high-temperature operation capability is owing to the quality improvement of NiO/Ga2O3 interface, where the Shockley-Read-Hall (SRH) recombination mediated by deep-level defects within the depletion region is thus suppressed.

Field-Plated NiO/Ga2O3 p-n Heterojunction Power Diodes With High-Temperature Thermal Stability and Near Unity Ideality Factors

Field-Plated NiO/Ga₂O₃ p-n Heterojunction Power Diodes With High-Temperature Thermal Stability and Near Unity Ideality Factors