English (United Kingdom)

https://curated-unify.zendy.io/wp-json/zendy-region/v1/featured_content/oa?rat=en

https://curated-unify.zendy.io/wp-json/zendy-region/v1/highlighted_journal/

Global: Zendy Plus annual

Presents the access of premium content as premium feature

Premium Content

Presents the keyphrase highlighting as premium feature

Keyphrase Highlighting

Presents the summarisation as premium feature

Summarisation

Insights

Presents the pdf analysis as premium feature

PDF Analysis

Presents the zaia usage as premium feature

ZAIA

Global: Zendy Tools annual

Global: Zendy Free Plan

Global: Zendy Tools monthly

Global: Zendy Plus monthly

In this paper, X‐ray and γ‐ray propagation in crystals having a constant strain gradient and flat or cylindrical surfaces is investigated. When a displacement field is present, the Takagi–Taupin equations are solved either by the Riemann–Green method or by a numerical method. The results are applied to study the operation of a double‐crystal Laue–Laue diffractometer having a flat collimating crystal followed by a bent analyzer crystal. In particular, the effect of the analyzer strain on the location of the diffraction peaks in the dispersive and non‐dispersive set‐up is examined, thus confirming the previously reported peak location as being set only by the diffracting‐plane spacing on the analyzer entrance surface.

X‐ray and γ‐ray propagation in bent crystals with flat and cylindrical surfaces