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We reconsider the long-standing problem of accurate measurement of atomic form factors for fundamental and applied problems. We discuss the X-ray extended-range technique for accurate measurement of the mass attenuation coefficient and the imaginary component of the atomic form factor. Novelties of this approach include the use of a synchrotron with detector normalisation, the direct calibration of dominant systematics using multiple thicknesses, and measurement over wide energy ranges with a resulting improvement of accuracies by an order of magnitude. This new technique achieves accuracies of 0.27– 0.5% and reproducibility of 0.02% for attenuation of copper from 8.84 to 20 keV, compared to accuracies of 10% using atomic vapours. This precision challenges available theoretical calculations. Discrepancies of 10% between current theory and experiments can now be addressed.  2001 Elsevier Science B.V. All rights reserved. PACS: 78.20.Ci; 32.80.Cy; 78.70.Dm; 78.20.Bh

acta crystallographica. section a, foundations of crystallography/acta crystallographica. section a

X-ray extended-range technique for precision measurement of the X-ray mass attenuation coefficient and IM(F) for molybdenum using synchrotron radiation