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Purpose designed instrumentation has allowed time-resolved X-ray diffraction at the Daresbury Laboratory Synchrotron Radiation Source (SRS) and the European Synchrotron Radiation Facility (ESRF) to be used to characterize changes in molecular conformation and organization in response to mechanical stress over a range of temperatures in a variety of polymer materials. The high brilliance of the synchrotron sources has allowed small (SAXS) and wide (WAXS) angle diffraction patterns to be recorded with time-resolutions as short as 40 msecs. Instrumentation has been developed which allows SAXS, WAXS and a video image of the specimen to be recorded simultaneously allowing determination of the strain at the point from where the X-ray diffraction data was recorded. Novel analytical techniques have been developed which have allowed distinct relaxation modes to be distinguished from WAXS data recorded during and subsequent to deformation of films of poly(ethylene terephthalate) (PET). Simultaneous SAXS and WAXS data recorded from a variety of grades of polyethylene have allowed changes in polymer conformation in response to mechanical stress to be related to changes in polymer organization. A novel micro-stretching device capable of recording stress/strain data has been used at the microfocus beamline ID13 at the ESRF with beam dimensions as small as a few microns to relate changes in mechanical properties of struts from polyurethane foams to structural transitions characterized in simultaneously recorded X-ray diffraction.

Time-resolved X-ray studies of stress induced changes in polymer structure