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Anomalous heating of trapped atomic ions is a major obstacle to their use asquantum bits in a scalable quantum computer. The physical origin of thisheating is not fully understood, but experimental evidence suggests that it iscaused by electric-field noise emanating from the surface of the trapelectrodes. In this study, we have investigated the role that adsorbates on theelectrodes play by identifying contaminant overlayers, developing an in situargon-ion beam cleaning procedure, and measuring ion heating rates before andafter cleaning the trap electrodes' surfaces. We find a reduction of two ordersof magnitude in heating rate after cleaning.

Reduction of anomalous heating in an in-situ-cleaned ion trap