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Neutron and X-ray reflectometry are powerful techniques facilitating thestudy of the structure of interfacial materials. The analysis of thesetechniques is ill-posed in nature requiring the application of amodel-dependent methods. This can lead to the over- and under- analysis ofexperimental data, when too many or too few parameters are allowed to vary inthe model. In this work, we outline a robust and generic framework for thedetermination of the set of free parameters that is capable of maximising thein-formation density of the model. This framework involves the determination ofthe Bayesian evidence for each permutation of free parameters; and is appliedto a simple phospholipid monolayer. We believe this framework should become animportant component in reflectometry data analysis, and hope others moreregularly consider the relative evidence for their analytical models.

A general approach to maximise information density in neutron reflectometry analysis