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In this work, a general theoretical framework is presented to explain theformation of the phase signal in an X-ray microscope integrated with a gratinginterferometer, which simultaneously enables the high spatial resolutionimaging and the improved image contrast. Using this theory, several keyparameters of phase contrast imaging can be predicted, for instance, the fringevisibility and period, the conversion condition from the differential phaseimaging (DPI) to the phase difference imaging (PDI). Additionally, numericalsimulations are performed with certain X-ray optical components and imaginggeometry. Results demonstrate the accuracy of this developed quantitativeanalysis method of X-ray phase-sensitive microscope imaging.

X-ray phase-sensitive microscope imaging with a grating interferometer: theory and simulation