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We report on the determination of the spin Hall angle and the identificationof the role of the interface roughness for the inverse spin Hall effect (ISHE)in ultra-clean, defect-reduced epitaxial Pt films. By applying vector networkanalyzer ferromagnetic resonance spectroscopy to a series of single crystallineFe (12 nm) /Pt (t$_\text{Pt}$) bilayers we determine the real part of the spinmixing conductance $(4.4\:\pm\:0.2)\cdot 10^{19}\: $m$^{-2}$ and reveal a verysmall spin diffusion length in the epitaxial Pt $(1.1\:\pm\:0.1)$ nm film. Weinvestigate the spin pumping and ISHE in a stripe microstucture excited by amicrowave coplanar waveguide (CPW) antenna. By using their different angulardependencies, we distinguish between spin rectification effects and the inversespin Hall effect. The relatively large value of the spin Hall angle $(5.7 \pm1.4)\: \% $ hints that interface engineering by epitaxially grown non-magneticmaterials can increase the spin-to-charge current conversion efficiency.

Determination of the spin Hall angle in single-crystalline Pt films from spin pumping experiments