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We demonstrated that an iodine stabilized Distributed Bragg Reflector (DBR)diode based laser system lasing at a wavelength in close proximity to $\lambda= 633\,$nm could be used as an alternative laser source to the He-Ne lasers inboth scientific and industrial metrology. This yields additional advantagesbesides the optical frequency stability and coherence: inherent traceability,wider optical frequency tuning range, higher output power and high frequencymodulation capability. We experimentally investigated the characteristics ofthe laser source in two major steps: first using a wavelength meter referencedto a frequency comb controlled with a hydrogen maser and then on ainterferometric optical bench testbed where we compared the performance of thelaser system with that of a traditional frequency stabilized He-Ne laser. Theresults indicate that DBR diode laser system provides a good laser source forapplications in dimensional (nano)metrology, especially in conjunction withnovel interferometric detection methods exploiting high frequency modulation ormultiaxis measurement systems.

Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode