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Current-voltage characteristics of Au~/~YBa$_2$Cu$_3$O$_{7-\delta}$interfaces (Au/YBCO), built on optimally-doped YBCO thin films, grown by pulsedlaser deposition, were measured as a function of temperature in the 50 K to 270K range, for two different resistance states. A non-trivial equivalent circuitmodel is proposed, which reveals the existence of a highly inhomogeneousscenario composed by two complex layers: one presenting both a non-linearPoole-Frenkel conduction as well as Variable Range Hopping localization effects(probably associated with YBa$_2$Cu$_3$O$_{6}$) mixed with a minor metallicphase, while the other is also composed by a mixture of YBCO with differentoxygen contents, where a metallic ohmic phase still percolates. A microscopicdescription of the effects produced by the resistance switching is given,showing the evolution of carrier traps, localization effects and dielectricbehavior for each state. The dielectric behavior is interpreted in terms of aMaxwell-Wagner scenario.

Electrical conduction mechanisms of metal / high-Tc superconductor (YBCO) interfaces