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SrFe$_{12}$O$_{19}$ (SFO) films grown on Si (100) substrates byradio-frequency magnetron sputtering have been characterized in terms ofcomposition, structural and magnetic properties by a combination of microscopy,diffraction and spectroscopy techniques. M\"ossbauer spectroscopy was used todetermine the orientation of the films magnetization, which was found to becontrolled by both the sputtering power and the thickness of the films.Additionally, the coupling between the SFO films and a deposited cobaltoverlayer was studied by means of synchrotron-based spectromicroscopytechniques. A structural coupling at the SFO/Co interface is suggested toaccount for the expetimental observations. Micromagnetic simulations wereperformed in order to reproduce the experimental behaviour of the system.

Influence of the growth conditions on the magnetism of SrFe$_{12}$O$_{19}$ thin films and the behavior of Co / SrFe$_{12}$O$_{19}$ bilayers