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We report the fabrication and the characterization of carbon fibre tips fortheir use in combined scanning tunnelling and force microscopy based onpiezoelectric quartz tuning fork force sensors. We find that the use of carbonfibre tips results in a minimum impact on the dynamics of quartz tuning forkforce sensors yielding a high quality factor and consequently a high forcegradient sensitivity. This high force sensitivity in combination with highelectrical conductivity and oxidation resistance of carbon fibre tips make themvery convenient for combined and simultaneous scanning tunnelling microscopyand atomic force microscopy measurements. Interestingly, these tips are quiterobust against occasionally occurring tip crashes. An electrochemicalfabrication procedure to etch the tips is presented that produces a sub-100 nmapex radius in a reproducible way which can yield high resolution images.

Carbon fibre tips for scanning probe microscopy based on quartz tuning fork force sensors