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Dissipation-free current transport in high-temperature superconductors is oneof the most crucial properties of this class of materials which is directlyrelated to the effective inhibition of flux line movement by defect structures.In this respect epitaxially grown thin films of YBa2Cu3O7-d (YBCO) are provingto be the strongest candidates for many widescale applications that are closeto realization. We show that the relation between different defect structuresand flux line pinning in these films exhibits universal features which areclearly displayed in a detailed analysis of the temperature-dependent behaviourof local critical currents. This allows us to identify different pinningmechanisms at different temperatures to be responsible for the found criticalcurrents. Additionally, the presence of grain boundaries with very lowmisorientation angles affects the temperature stability of the criticalcurrents which has important consequences for future applications.

Universal temperature scaling of flux line pinning in high-temperature superconducting thin films