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In order to describe texture and microstructure of a polycrystalline material completely, crystal orientation   g  =   {    ϕ  1   Φ   ϕ  2    }must be known in all points   x  =   {    x  1       x  2       x  3    }    of the material. This can be achieved by locationresolveddiffraction of high-energy, i.e. short-wave, X-rays from synchrotron sources. Highest resolution inthe orientation- as well as the location-coordinates can be achieved by three variants of a detector “sweeping”technique in which an area detector is continuously moved during exposure. This technique results intwo-dimensionally continuous images which are sections and projections of the six-dimensional “orientation–location” space. Further evaluation of these images depends on whether individual grains are resolvedin them or not. Because of the high penetration depth of high-energy synchrotron radiation in matter, thistechnique is also, and particularly, suitable for the investigation of the interior of big samples.

High-Resolution Imaging of Texture and Microstructure by the Moving Detector Method