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Layered structured ceramic compounds have significant characteristics in the field of materials research. A new Aurivillius structured compound, CaBi 4 Ti 3 ZrO 15 , is processed by using solid-state reaction technique process. It is calcined at 830 °C followed by a sintering process at 880 °C. Orthorhombic structure of the material is confirmed from X-ray diffraction analysis. Grain size analysis is done through the scanning electron microscopy. Relative permittivity of the sample rises with rise in frequency and temperature and no phase transition is noticed in the experimental temperature regime. The complex impedance spectroscopy method is employed to study the immittance properties of the material within the range of frequency from 100 Hz to 10 MHz and temperature range from 30 to 500 °C. The complex impedance plot confirms the electrical behaviour of the compound which is because of the bulk and bulk interface effect. Absence of third semicircle in the complex impedance plane indicates the complete absence of electrode–materials effect on overall electrical response for this compound. The presence of non-Debye-like relaxation formalism is seen in the Nyquist plots. The temperature-dependent conductivity shows negative temperature coefficient of resistance character obeying Arrhenius equation. The temperature-dependent conductivity shows semiconducting properties of the sample. The response of hysteresis plot for the sample (P-E loop) confirms the ferroelectric property within the material.

Electrical characterization of CaBi 4 Ti 3 ZrO 15 ceramic