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We present the development of a high-precision sample-position-autocorrectionsystem for photoemission experiments. A binocular vision method based on imagepattern matching calculations was realized to track the sample position with anaccuracy better than 1 \um, which was much smaller than the spot size of theincident laser. We illustrate the performance of thesample-position-autocorrection system with representative photoemission data onthe topological insulator Bi$_2$Se$_3$ and an optimally-doped cupratesuperconductor \Bi. Our method provides new possibilities for studying thetemperature-dependent electronic structures in quantum materials by laser-basedor spatially resolved photoemission systems with high precision and efficiency.

A sample-position-autocorrection system with precision better than 1 \um~in angle-resolved photoemission experiments