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In the present work we have analyzed the Ni K-edge XANES of two series of families in order to determine their Ni oxidation state : i) the hole doped Nd2-xSrxNiO4 (0.2+x+0.8) ; and ii) the reduced Nd2-xSrxNiOy (0.2+x+0.5 and 3.5+y+3.79). The Ni K-edge XANES shows an increase of Ni(III) content with the Sr concentration for the hole doped samples. Additionally, the reduced family shows the disappearance of Ni(III), a decrease of Ni(II) with respect to the non-reduced one and an increase of Ni(I)

Ni K-Edge XANES Studies of Hole Doped Nd2-xSrxNiO4and Reduced Nd2-xSrxNiOy

Ni K-Edge XANES Studies of Hole Doped Nd_2-xSr_xNiO₄and Reduced Nd_2-xSr_xNiO_y