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Recent attacks using thermal laser stimulation (TLS) have shown that it ispossible to extract cryptographic keys from the battery-backed memory onstate-of-the-art field-programmable gate arrays (FPGAs). However, theprofessional failure analysis microscopes usually employed for these attackscost in the order of 500k to 1M dollars. In this work, we evaluate the use of acheaper commercial laser fault injection station retrofitted with a suitableamplifier and light source to enable TLS. We demonstrate that TLS attacks arepossible at a hardware cost of around 100k dollars. This constitutes areduction of the resources required by the attacker by a factor of at leastfive. We showcase two actual attacks: data extraction from the SRAM memory of alow-power microcontroller and decryption key extraction from a 20-nm technologyFPGA device. The strengths and weaknesses of our low-cost approach are thendiscussed in comparison with the conventional failure analysis equipmentapproach. In general, this work demonstrates that TLS backside attacks areavailable at a much lower cost than previously expected.

Evaluation of Low-Cost Thermal Laser Stimulation for Data Extraction and Key Readout