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Here, we propose a method to determine the thickness of the most commontransition metal dichalcogenides (TMDCs) placed on the surface of transparentstamps, used for the deterministic placement of two-dimensional materials, byanalyzing the red, green and blue channels of transmission-mode opticalmicroscopy images of the samples. In particular, the blue channel transmittanceshows a large and monotonic thickness dependence, making it a very convenientprobe of the flake thickness. The method proved to be robust given the smallflake-to-flake variation and the insensitivity to doping changes of MoS2. Wealso tested the method for MoSe2, WS2 and WSe2. These results provide areference guide to identify the number of layers of this family of materials ontransparent substrates only using optical microscopy.

Thickness determination of MoS2, MoSe2, WS2 and WSe2 on transparent stamps used for deterministic transfer of 2D materials