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Polarized neutron reflectometry is used to study the magnetic proximityeffect in a superconductor/ferromagnet (SC/FM) system of compositionCu(32nm)/V(40nm)/Fe(1nm)/MgO. In contrast to previous studies, here a singleSC/FM bilayer, is studied and multilayer artefacts are excluded. The necessarysignal enhancement is achieved by waveguide resonance, i.e. preparing theV(40nm)/Fe(1nm) SC/FM bilayer sandwiched by the highly reflective MgO substrateand Cu top layer, respectively . A new magnetic state of the system wasobserved at temperatures below 0.7 TC. manifested in a systematic change in theheight and width of the waveguide resonance peak. Upon increasing thetemperature from 0.7 TC to TC, a gradual decay of this state is observed,accompanied by a 5% growth of the diffuse scattering. According to theoreticalstudies, such behavior is the result of the magnetic proximity effect. Due tothe presence of the thin FM layer the superconducting electrons are polarizedand, as a result, near the SC/FM interface an additional magnetic layer appearsin the SC with thickness comparable to ksi, the coherence length of thesuperconductor.

Magnetic proximity effects in V/Fe superconductor/ferromagnet single bilayer revealed by waveguide-enhanced polarized neutron reflectometry