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We classify and analyze bit errors in the current measurement mode of theKirchhoff-law-Johnson-noise (KLJN) key distribution. The error probabilitydecays exponentially with increasing bit exchange period and fixed bandwidth,which is similar to the error probability decay in the voltage measurementmode. We also analyze the combination of voltage and current modes for errorremoval. In this combination method, the error probability is still anexponential function that decays with the duration of the bit exchange period,but it has superior fidelity to the former schemes.

Current and voltage based bit errors and their combined mitigation for the Kirchhoff-law-Johnson-noise secure key exchange